Category VLSI Interview QA

Scan chain reordering in VLSI: scan DEF, partitions, hold timing and ATPG

Scan Chain Reordering in VLSI: Scan DEF, Partitions, Hold Timing and ATPG Impact

Scan chain reordering in VLSI physical design explained: why synthesis scan order wastes wirelength, what the scan DEF (START/STOP, FLOATING, ORDERED, PARTITION, MAXBITS) allows, clock-domain, edge-order and lockup-latch rules, chain balancing, scan shift hold timing, verification and ATPG regeneration, with illustrative examples, a debugging flowchart and interview Q&As.

ECO in VLSI physical design: timing ECOs, spare cells and metal-only fixes

ECO in VLSI Physical Design: Timing ECOs, Functional ECOs, Spare Cells and Metal-Only Fixes

ECO (Engineering Change Order) in VLSI physical design explained: timing, DRV, noise, leakage and functional ECOs, pre-mask vs post-mask (metal-only) changes, spare cells, the sign-off STA to place-and-route ECO loop, what to re-verify after every ECO and how to debug an ECO that will not converge, with illustrative examples and interview Q&As.

Multicycle path and false path in STA: setup/hold multipliers, -start/-end and exception precedence

Multicycle Path and False Path in STA: Setup/Hold Multipliers, -start/-end and Exception Precedence

Multicycle paths and false paths in STA explained for physical design and timing engineers: how set_multicycle_path moves setup and hold checks, why setup N needs hold N-1, -start vs -end across clocks, valid and dangerous false paths, clock groups, exception precedence and a debugging flow, with illustrative examples and interview Q&As.